multiferroic materials

Electrical and magnetic anisotropies in van der Waals multiferroic CuCrP2S6

Fig. 2 from “Electrical and magnetic anisotropies in van der Waals multiferroic CuCrP2S6” by Xiaolei Wang et al.: Electrical measurements of the AFE CCPS indicating local FE polarization and electrical anisotropy. a Phase vs voltage hysteresis loop of CCPS crystal bulk obtained at T = 2 K by PFM, after subtracting the built-in electric field between the sample and substrate. The upper inset diagram indicates the atomic structure of electric field (E) driven FE polarized state. b The microscope picture of our CCPS device with identified a and b axes, along with the scale-up configuration of electrical measurements on the right. c The rectifying J–V characteristics along the a and b axes as positive +10 V bias is poling for 3 min. d The rectification behaviors as increasing the poling voltage to 6 min or longer. e Time dependence of current density along the a and b axes as setting the poling bias +10 V. f The negative rectification along the a axis as the poling voltage is −10 V for 3 min. g The schematic diagram of physical mechanism illustrating the in-plane electrical anisotropy. NANOSENSORS™ conductive and wear resistant Platinum-Silicide PtSi-FM AFM probes were used for the low-temperature piezoresponse force microscopy.

In the field of modern information storage, the physical properties could act as the storage “medium”, such as electric polarization (dipole orientation) of ferroelectric materials,… Read More »Electrical and magnetic anisotropies in van der Waals multiferroic CuCrP2S6

Domain-wall magnetoelectric coupling in multiferroic hexagonal YbFeO3 films

Supplementary Figure.S15 from “Domain-wall magnetoelectric coupling in multiferroic hexagonal YbFeO3 films” by Xin Li et al.: (a) MFM images of h-YbFeO3(001)/ YSZ(111), which were measured in the phase-lock mode 100 nm above the surface with a 3×3 m scan area. The gray scale of the images corresponds to the frequency shift, whose full scale is 1 Hz. The arrows indicate the sequence of the applied magnetic field along the c axis of h-YbFeO3 films. (b) Surface topography of h-YbFeO3 films measured by AFM with a 75 nm full grey scale. (c) Magnetic-field dependence of the roughness of the MFM images calculated using the central part of the images in (a). (d) The distribution of magnetic domain sizes extracted from the central part of the images in (a) with reducing magnetic field. All measurements were taken at 12 K. NANOSENSORS PPP-MFMR AFM probes with magnetic coating were used.

Electrical modulation of magnetic states in single-phase multiferroic materials, using domain-wall magnetoelectric (ME) coupling, can be enhanced substantially by controlling the population density of the… Read More »Domain-wall magnetoelectric coupling in multiferroic hexagonal YbFeO3 films