nanoscale

A comparative nanotribological investigation on amorphous and polycrystalline forms of MoS2

by NANOSENSORS
15 November 2024
Science & Technology

Figure S5 from Hesam Khaksar et al. 2024 “A comparative nanotribological investigation on amorphous and polycrystalline forms of MoS2”: AFM image on the scratched area with the AFM (contact mode image) Fig. S5 shows a collection of images captured by the atomic force microscope, which displays scratches on two different materials. The first row shows scratches on amorphous material, while the second row shows scratches on polycrystalline material. Within each row, the force used to create the scratches was increased from 2 to 15 μN . The NANOSENSORS diamond coated DT-NCHR AFM probe was used to create the scratches and capture the images, allowing for a detailed examination of the surface features and material properties.

Molybdenum disulfide (MoS2) is commonly used as a dry lubricant due to its enhanced performance in the absence of oxygen and its elevated temperature stability,… Read More »A comparative nanotribological investigation on amorphous and polycrystalline forms of MoS2

Carbon Thin-Film Electrodes as High-Performing Substrates for Correlative Single Entity Electrochemistry

by NANOSENSORS
26 September 2024
Science & Technology

S15 from Marc Brunet Cabré et al 2024 “Carbon Thin-Film Electrodes as High-Performing Substrates for Correlative Single Entity Electrochemistry” SI-5: Morphology of isolated MXene (Ti3C2Tx) on anC by AFM Figure S15: AFM images of two different regions of anC substrate with dropcasted MXene flakes. (A) Displays an isolated flake on anC and (B) displays multiple flakes which present partial stacking between them. NANOSENSORS PointProbe® Plus PPP-NCHR AFM probes were used for the scanning probe microscopy (SPM) characterization in non-contact mode.

Single-entity electrochemistry (SEE) is an emerging area of research that aims at evaluating the electrochemical response of materials at the micro- and nanoscale. * Several… Read More »Carbon Thin-Film Electrodes as High-Performing Substrates for Correlative Single Entity Electrochemistry

Electron-beam lithography of nanostructures at the tips of scanning probe cantilevers

by NANOSENSORS
16 February 2024
Science & Technology

It is always exiting to see what our creative and innovative users are doing with our AFM probes. In their article “Electron-beam lithography of nanostructures… Read More »Electron-beam lithography of nanostructures at the tips of scanning probe cantilevers

Toward Single-Atomic-Layer Lithography on Highly Oriented Pyrolytic Graphite Surfaces Using AFM-Based Electrochemical Etching

by NANOSENSORS
9 October 202215 March 2023
Science & Technology

Figure 2 from Wei Han et al. “Toward Single-Atomic-Layer Lithography on Highly Oriented Pyrolytic Graphite Surfaces Using AFM-Based Electrochemical Etching” Schematic diagram of the AFM-based electrochemical etching apparatus with an RH-controlled environment. The experiments were performed under ambient conditions with a commercial atomic force microscope using NANOSENSORS PtIr5 coated PointProbePlus® PPP-EFM AFM probes. The AFM tip side coating enhances the conductivity of the AFM tip and allows electrical contacts, and the opposite side coating enhances the laser reflex.

Happy #NanotechnologyDay! The date, 10/9, is a nod to the nanometer scale, where objects span only billionths of a meter (10⁻⁹ meters). We celebrate it… Read More »Toward Single-Atomic-Layer Lithography on Highly Oriented Pyrolytic Graphite Surfaces Using AFM-Based Electrochemical Etching

Stress- and Time-Dependent Formation of Self-Lubricating In Situ Carbon (SLIC) Films on Catalytically-Active Noble Alloys

by NANOSENSORS
16 June 202215 March 2023
Science & Technology

Figure 5 from Morgan R. Jones et al. Stress- and Time-Dependent Formation of Self-Lubricating In Situ Carbon (SLIC) Films on Catalytically-Active Noble Alloys: Tribofilm formation as a function of number of cycles as determined from the nanoscale experiments. (a) Intermittent-contact mode topography images (3 µm × 3 µm area) of the contact region at a contact pressure of 1.2 GPa after 0 cycles, 500 cycles, 1000 cycles, 2000 cycles, 3000 cycles, and 4000 cycles. (b) Tribofilm volume as a function of cycles for contact pressures up to 3.1 GPa. For all P, tribofilm volume increased asymptotically to a steady-state value at large numbers of cycles. NANOSENSORS Diamond Coated PointProbe Plus AFM probes DT-CONTR were used for the nanoscale tribology with atomic force microscopy.

Although catalysis is a popular explanation for tribopolymer generation, the interplay of catalysis, mechanochemistry, and electrostatic interactions remain incompletely understood. There is consensus, however, that… Read More »Stress- and Time-Dependent Formation of Self-Lubricating In Situ Carbon (SLIC) Films on Catalytically-Active Noble Alloys

Nanoscale Charge Accumulation and Its Effect on Carrier Dynamics in Tri-cation Perovskite Structures

by NANOSENSORS
26 November 202015 March 2023
Science & Technology

Figure 3. from “Nanoscale Charge Accumulation and Its Effect on Carrier Dynamics in Tri-cation Perovskite Structures” by David Toth et al: Initial dark and relaxed closed-loop KPFM analysis of CsFAMAPbBrI. (a) Topography channel plotting surface height. (b) KPFM image prior to light pulse plotting Vcpd. (c) KPFM image seconds after the light pulse plotting Vcpd. (d) 3D topography overlaid with the calculated ΔVcpd map. (e) Histograms of before and after Vcpd maps separated into grain and GB responses. The double arrows indicate the difference between the mean values of the distributions. NANOSENSORS™ Platinumum-Silicide PtSi-CONT AFM probes were used for the KPFM measurements.

Nanoscale investigations by scanning probe microscopy have provided major contributions to the rapid development of organic–inorganic halide perovskites (OIHP) as optoelectronic devices. Further improvement of… Read More »Nanoscale Charge Accumulation and Its Effect on Carrier Dynamics in Tri-cation Perovskite Structures