pendulum atomic force microscopy

Energy dissipation on magic angle twisted bilayer graphene

by NANOSENSORS
11 December 202411 December 2024
Science & Technology

Fig. 1 a and b from Alexina Ollier et al 2023 “Energy dissipation on magic angle twisted bilayer graphene”: Pendulum atomic force microscope (p-AFM) tip oscillating on top of a twisted bilayer graphene (tBLG) device is measuring energy loss. a schematics of the measured device. The sample is composed of a p-doped silicon backgate (dark gray), followed by a 300 nm thick silicon dioxide layer (violet) and 10 nm hexagonal boron nitride (hBN, light blue). From the top tBLG is encapsulated with 10nm hBN film. b p-AFM image of the tBLG device, the white dotted rectangle is the device with a size of 4.1 μm × 5.8 μm. NANOSENSORS AdvancedTEC ATEC-CONT tip-view AFM probes were used.

Traditional Joule dissipation omnipresent in today’s electronic devices is well understood while the energy loss of the strongly interacting electron systems remains largely unexplored. Twisted… Read More »Energy dissipation on magic angle twisted bilayer graphene