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Platinum Silicide AFM probes

World Science Day

Single pass Kelvin Force Microscopy

Sergei Magonov from NT-MDT captured this extremly impressing single pass Kelvin Force Micoscopy image of self-assemblies of semifluorinated alkanes (F12H12)

KPFM_01

Single-pass Kelvin Force Microscopy (KFM-PM) scan of self-assemblies of semifluorinated alkanes (F12H12) on HOPG. Height, capacitance gradients dC/dZ and dC/dV and surface potential. Images courtesy by Sergei Magonov, obtained with a NT-MDT Titanium scanning probe microscope and a NANOSENSORS PtSi-FM probe.

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视频介绍 – 铂硅原子力显微镜探针 – NANOSENSORS™ –

视频介绍 – 铂硅原子力显微镜探针 – NANOSENSORS™ – 在 Youtube 和在  Youku http://v.youku.com/v_show/id_XNjkzNzU3ODky.html?from=y1.7-1.2 NANOSENSORS公司的吴烨娴博士在本视频中介绍了铂硅原子力显微镜探针。该种探针结合了优良的导电性，高耐磨性和超小型针尖半径为一体，专为导电或静电AFM成像设计。 与传统的导电型AFM针尖比较，它的质地更加地坚硬。和金刚石涂层的AFM针尖比较，铂硅探针的尖端半径只有1/5甚至1/6（~25纳米），而却有其 10倍的导电系数。而且这种探针的磨损率与硅和其他金属涂覆的探针相比显著降低。此外，硅化铂几乎耐受所有类型的化学药品。 http://www.nanosensors.com/Platinum_Silicide.pdf 此款铂硅AFM针尖可适用于 导电原子力显微镜 隧道原子力显微镜 扫描电容显微镜 开尔文探针力显微镜 和 静电力显微镜 需要注意的时，由于此类铂硅针尖的尖端有很高的长径比和很小的曲率半径，此类针尖不适用于表面受力很大的扫描扩展电阻显微镜

Platinum Silicide Probes for Contact Mode (PtSi-CONT) are now available

NANOSENSORS™ announced that now all three basic types of the new innovative SPM probes series of wear resistant and highly conductive AFM tips are available.
The new AFM probes feature the best of both worlds of the most commonly used conductive probes for Atomic Force Microscopy (AFM): metal coated probes and probes with conductive diamond coating.

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