Diamond has a high breakdown field, high carrier mobilities and the highest thermal conductivity. That is why diamond is a promising material for next generation… Read More »Conductive-probe atomic force microscopy and Kelvin-probe force microscopy characterization of OH-terminated diamond (111) surfaces with step-terrace structures
“Fast growth in Internet of Things (IoT) has attracted a lot of attention of flexible and easily processable hybrid organic-inorganic nanomaterials, integrated into modern electronics… Read More »Conductive Polymer-Ag Honeycomb Thin Film: The Factors Affecting the Complexity of the Microstructure
The screencast on the wear-resistant conductive platinum silicide AFM probes -( PtSi) held by Dr. Oliver Krause on Youtube https://youtu.be/w0Tjg08ai-I has just passed the 500… Read More »Wear-resistant Conductive Platinum Silicide AFM Probes (PtSi) Video has 500 views
Our product screencast on the Platinum Silicide AFM Probes series from NANOSENSORS™ is now available in Japanese. NANOSENSORS™ Platinum Silicide AFM probes are designed for… Read More »Product Screencast NANOSENSORS™ Platinum Silicide AFM probes (Japanese – 日本語)
For the full brochure please follow this link: http://www.nanosensors.com/pdf/platinum_silicide.pdf
Again, we got an impressive image from AFM icon Sergei Magonov, NTMDT USA. Sergei imaged a Perovskite PLZT sample on NT-MDTs AFM flagship, the Titanium… Read More »Piezoresponse Force Microscopy by Sergei Magonov
Sergei Magonov from NT-MDT captured this extremly impressing single pass Kelvin Force Micoscopy image of self-assemblies of semifluorinated alkanes (F12H12)
Single-pass Kelvin Force Microscopy (KFM-PM) scan of self-assemblies of semifluorinated alkanes (F12H12) on HOPG. Height, capacitance gradients dC/dZ and dC/dV and surface potential. Images courtesy by Sergei Magonov, obtained with a NT-MDT Titanium scanning probe microscope and a NANOSENSORS PtSi-FM probe.