The screencast held by Head of R&D Thomas Sulzbach on the NANOSENSORS PointProbe® Plus Silicon AFM probe series with a consistent tip shape leading to… Read More »Consistent AFM tip shape leading to reproducible results – NANOSENSORS PointProbe Plus Screencast passes 500 views mark
A NANOSENSORS PPP-EFM AFM tip was used in the research for this paper. Nature Comm: GMode makes piezoresponse force microscopy 1000 times faster. Suhas Somnath,,… Read More »Rapid mapping of polarization switching through complete information acquisition
Seasonal Special Development: PointProbe Plus AFM tip with pine, snow and star coating. Happy Holidays to you all!
走査型プローブ顕微鏡(SPM)および原子間力顕微鏡(AFM)に使われるプローブ/カンチ レバーには選択に困るほど数多くの種類があります。だからこそ、まずはこれをお使 いくださいとお勧めするのは「シリコン標準プローブ PointProbe®Plus」。「標準」 に求められる高品質と高精度を備え幅広いアプリケーションにご利用頂けます。 https://youtu.be/4eiL8lpQ3fE
Did you already know that NANOSENSORS offers four different kinds of AFM probes especially designed for use in UHV applications?
For high sensitivity and a good signal to noise ratio these probes are featuring a Q-factor of over 30,000 (up to 50,000) under UHV conditions and a high reflectivity (even at wavelength of over 800nm).
Read More »NANOSENSORS Q30K-Plus – Silicon AFM probes for UHV applications
Product screencast on the NANOSENSORS™ PointProbe® Plus XY-Alignment Series, held by the head of NANOSENSORS™ R&D department Thomas Sulzbach. A common problem of probe mounting… Read More »Product Screencast NANOSENSORS™ XY-Alignment Series
Product Screencast on the NANOSENSORS™ Diamond Coated PointProbe® Plus Silicon AFM Probes by Jörg Diebel.
Read More »Product screencast NANOSENSORS™ Diamond Coated PointProbe Plus Silicon AFM Probes