NANOSENSORS™ introduces next generation XY-Alignment AFM probe – easy tip exchange without laser repositioning
NANOSENSORS™ today introduced its new PointProbe® Plus XY-Alignment series.
The invention of the Alignment Chip by NANOSENSORS™ more than 10 years ago marked a big step in the direction of AFM probe design for easy to use AFM systems. It offered the possibility of a fast and easy tip exchange without the necessity to reposition the laser beam after the exchange of a probe.
