Zeno Schumacher, Yoichi Miyahara and Peter Grütter from McGill University, Montreal together with our colleague Laure Aeschimann from NANOSENSORS™ are showing in their current publication… Read More »Partial Coatings of AFM Cantilevers II
Zeno Schumacher, Yoichi Miyahara and Peter Grütter from McGill University, Montreal together with our colleague Laure Aeschimann from NANOSENSORS™ are showing in their current publication… Read More »Partial Coatings of AFM Cantilevers I
Did you already know that NANOSENSORS offers four different kinds of AFM probes especially designed for use in UHV applications?
For high sensitivity and a good signal to noise ratio these probes are featuring a Q-factor of over 30,000 (up to 50,000) under UHV conditions and a high reflectivity (even at wavelength of over 800nm).
Read More »NANOSENSORS Q30K-Plus – Silicon AFM probes for UHV applications
The new NANOSENSORS™ Q30K-Plus AFM tip with a very high Q-factor and an enhanced signal to noise ratio for UHV applications is now available. Based… Read More »NANOSENSORS™ Q30K-Plus Silicon AFM probes for Non-Contact Mode and Force Modulation Mode are now available
NANOSENSORS™ today announced the Q30K-Plus, a novel scanning proximity probe with an outstanding Q-factor and an enhanced signal to noise ratio for UHV applications. Based… Read More »NANOSENSORS™ announces new high-Q AFM probe