Nanoscale investigations by scanning probe microscopy have provided major contributions to the rapid development of organic–inorganic halide perovskites (OIHP) as optoelectronic devices. Further improvement of… Read More »Nanoscale Charge Accumulation and Its Effect on Carrier Dynamics in Tri-cation Perovskite Structures
Graphene, since its discovery in 2004 has attracted enormous interest due to its physical and chemical properties, and wide applications. * Graphene oxide (GO) has… Read More »Engineering work function of graphene oxide from p to n type using a low power atmospheric pressure plasma jet
Controlling the work function of transition metal oxides is of key importance with regard to future energy production and storage. As the majority of applications… Read More »Kelvin probe force microscopy work function characterization of transition metal oxide crystals under ongoing reduction and oxidation
In their study “Room Temperature Polarization Phenomena in Nanocrystalline and Epitaxial Thin Films of Gd-Doped Ceria Studied by Kelvin Probe Force Microscopy” Kerstin Neuhaus, Giuliano… Read More »Room Temperature Polarization Phenomena in Nanocrystalline and Epitaxial Thin Films of Gd-Doped Ceria Studied by Kelvin Probe Force Microscopy
NANOSENSORS PPP-NCSTAu probes were used for scanning probe characterizations for this publication. Cramer, T. et al. Direct imaging of Defect Formation in Strained Organic Flexible… Read More »Direct imaging of defect formation in strained organic flexible electronics by Scanning Kelvin Probe Microscopy
Our product screencast on the Platinum Silicide AFM Probes series from NANOSENSORS™ is now available in Japanese. NANOSENSORS™ Platinum Silicide AFM probes are designed for… Read More »Product Screencast NANOSENSORS™ Platinum Silicide AFM probes (Japanese – 日本語)
Sergei Magonov from NT-MDT captured this extremly impressing single pass Kelvin Force Micoscopy image of self-assemblies of semifluorinated alkanes (F12H12)
Single-pass Kelvin Force Microscopy (KFM-PM) scan of self-assemblies of semifluorinated alkanes (F12H12) on HOPG. Height, capacitance gradients dC/dZ and dC/dV and surface potential. Images courtesy by Sergei Magonov, obtained with a NT-MDT Titanium scanning probe microscope and a NANOSENSORS PtSi-FM probe.