scanning kelvin probe microscopy

Product Screencast NANOSENSORS™ Platinum Silicide AFM probes

by NANOSENSORS
29 August 201415 March 2023
Videos

Product screencast on the Platinum Silicide AFM Probes series from NANOSENSORS™ given by Dr. Oliver Krause. NANOSENSORS™ Platinum Silicide AFM probes are designed for conductive AFM imaging where the combination of excellent conductivity, high wear resistance and a small tip radius is required.

NANOSENSORS™ introduces new Wear Resistant Conductive AFM Probe Series

by NANOSENSORS
2 August 201215 March 2023
News & Events

NANOSENSORS™ announced that the first two types of a new innovative SPM probes series of wear resistant and highly conductive AFM tips will be introduced today.

The new AFM probes feature the best of both worlds of the most commonly used conductive probes for Atomic Force Microscopy (AFM): metal coated probes and probes with conductive diamond coating.