scanning probe microscopy (SPM)-based lithography

Toward Single-Atomic-Layer Lithography on Highly Oriented Pyrolytic Graphite Surfaces Using AFM-Based Electrochemical Etching

by NANOSENSORS
9 October 202215 March 2023
Science & Technology

Figure 2 from Wei Han et al. “Toward Single-Atomic-Layer Lithography on Highly Oriented Pyrolytic Graphite Surfaces Using AFM-Based Electrochemical Etching” Schematic diagram of the AFM-based electrochemical etching apparatus with an RH-controlled environment. The experiments were performed under ambient conditions with a commercial atomic force microscope using NANOSENSORS PtIr5 coated PointProbePlus® PPP-EFM AFM probes. The AFM tip side coating enhances the conductivity of the AFM tip and allows electrical contacts, and the opposite side coating enhances the laser reflex.

Happy #NanotechnologyDay! The date, 10/9, is a nod to the nanometer scale, where objects span only billionths of a meter (10⁻⁹ meters). We celebrate it… Read More »Toward Single-Atomic-Layer Lithography on Highly Oriented Pyrolytic Graphite Surfaces Using AFM-Based Electrochemical Etching