This collection of articles by Physical review letters marks the 35th anniversary of scanning tunneling microscopy and the 30th anniversary of atomic force microscopy http://journals.aps.org/prl/scanning-probe-microscopy… Read More »35th anniversary of scanning tunneling microscopy, 30th anniversary of atomic force microscopy and … 25 years NANOSENSORS AFM probes
Don’t forget to mark in your calendar to come and find us at NanoAndMore booth 610 at MRS Fall in Boston next week. The exhibition… Read More »Visit us at MRS Fall next week
The screencast on the history of NANOSENSORS AFM probes is now available in Chinese on youtube and youku NANOSENSORS 公司 – 原子力显微镜探针的发展史 在 Youtube 和在… Read More »NANOSENSORS 公司 – 原子力显微镜探针的发展史
Dr. Oliver Krause, product developer at NANOSENSORS™ is talking in this screencast about AFM probes for dynamic AFM with sub-nanometer amplitudes enabling imaging with atomic… Read More »NANOSENSORS™ Ultrastiff AFM Probes for Atomic Resolution
Visit us at Toyo booth 4B-705 at JASIS 2015 in Makuhari, Japan this week.
We will be attending the China Nano 2015 in Beijing this week from September 3-5, 2015 and can also be found in the exhibition hall… Read More »We’re in Beijing this week, you too?
The screencast on the history of NANOSENSORS AFM probes held by Dr. Oliver Krause has just passed the 500 views mark. You haven’t seen it… Read More »NANOSENSORS History Screencast has 500 Views