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Insights into dynamic sliding contacts from conductive atomic force microscopy

by NANOSENSORS
12 August 202015 March 2023
Science & Technology

Figure 1 (a) from “Insights into dynamic sliding contacts from conductive atomic force microscopy” by Nicholas Chan et al: A schematic of the experimental setup is shown in Fig. 1(a). The experiment was conducted using an ultra-high vacuum (UHV)AFM at room temperature at a pressure of

Friction in nanoscale contacts is determined by the size and structure of the interface that is hidden between the contacting bodies. One approach to investigating… Read More »Insights into dynamic sliding contacts from conductive atomic force microscopy

Soft, drift-reduced AFM cantilevers for Biology and Life Sciences – Uniqprobe Screencast passes the 1000 views mark

by NANOSENSORS
6 August 202015 March 2023
Inside NANOSENSORS, News & Events, Videos

The screencast on the soft, drift-reduced NANOSENSORS™ uniqprobe cantilevers for biology and life science applications held by Dr. Laure Aeschimann has just passed the 1000… Read More »Soft, drift-reduced AFM cantilevers for Biology and Life Sciences – Uniqprobe Screencast passes the 1000 views mark

Happy Swiss National Holiday with Smallest Swiss Cross

by NANOSENSORS
1 August 202015 March 2023
News & Events

Basel University : Smallest Swiss Cross – Made of 20 Single Atoms ( a NANOSENSORS PointProbePlus PPP-NCL AFM probe was used for this image)

Direct Measurement of Adhesion Force of Individual Aerosol Particles by Atomic Force Microscopy

by NANOSENSORS
26 July 202015 March 2023
Science & Technology

Figure 2 from «Direct Measurement of Adhesion Force of Individual Aerosol Particles by Atomic Force Microscopy» by Kohei Ono et al: Atomic force microscopy (AFM) mag image (a), slope mapping (b), and adhesion force mapping (c) obtained from the same 1 μm PSL particle. Representative force–distance curves are shown for the point at which the tip is properly in contact with the surface with sufficient stroke (loading force), at the proper angle (d) and for the point further towards the edge where the tip is barely touching the surface at a steep angle (e). The black lines in panels (d) and (e) show the baseline in which the tip did not touch the particle or substrate. A plot of the relationship between the slope and the adhesion force is shown in panel (f). The plots in the shaded area are considered to represent the adhesion force of the particle.

In the article «Direct Measurement of Adhesion Force of Individual Aerosol Particles by Atomic Force Microscopy» Kohei Ono, Yuki Mizushima, Masaki Furuya, Ryota Kunihisa, Nozomu… Read More »Direct Measurement of Adhesion Force of Individual Aerosol Particles by Atomic Force Microscopy

Gentle plasma process for embedded silver-nanowire flexible transparent electrodes on temperature-sensitive polymer substrates

by NANOSENSORS
14 July 202015 March 2023
Science & Technology

Figure 5. from “Gentle plasma process for embedded silver-nanowire flexible transparent electrodes on temperature-sensitive polymer substrates “ by Lukas Kinner et al.:

In the article “Gentle plasma process for embedded silver-nanowire flexible transparent electrodes on temperature-sensitive polymer substrates “ Lukas Kinner, Emil J W List-Kratochvil and Theodoros… Read More »Gentle plasma process for embedded silver-nanowire flexible transparent electrodes on temperature-sensitive polymer substrates

Development of a Lidocaine-Loaded Alginate/CMC/PEO Electrospun Nanofiber Film and Application as an Anti-Adhesion Barrier

by NANOSENSORS
25 June 202015 March 2023
Science & Technology

Surgery, particularly open surgery, is known to cause tissue/organ adhesion during healing. These adhesions occur through contact between the surgical treatment site and other organ,… Read More »Development of a Lidocaine-Loaded Alginate/CMC/PEO Electrospun Nanofiber Film and Application as an Anti-Adhesion Barrier

Simultaneous co-localized super-resolution fluorescence microscopy and atomic force microscopy: combined SIM and AFM platform for the life sciences

by NANOSENSORS
9 June 202015 March 2023
Science & Technology

Figure 4 a and b from Ana I. Gómez-Varela et al “Simultaneous co-localized super-resolution fluorescence microscopy and atomic force microscopy: combined SIM and AFM platform for the life sciences : Simultaneous SR-SIM/AFM acquisition. The AFM measurements were carried out on fixed U2OS cells in medium/buffer with (a) and without N-SIM illumination (b). For convenience and enhanced feature/noise contrast, both AFM topography images in the SR-SIM/AFM overlays are displayed with an edge detection algorithm using a pixel difference operator in X. The topography images from Petri dish surface on three positions (labelled in the figures) were planefit (1st order polynomial function) to compensate for tilts in the sample surface, and subjected to surface roughness analysis Please have a look at the full article to view the full figure. https://rdcu.be/b4Iot

Correlating data from different microscopy techniques holds the potential to discover new facets of signalling events in cellular biology.* In the article “Simultaneous co-localized super-resolution… Read More »Simultaneous co-localized super-resolution fluorescence microscopy and atomic force microscopy: combined SIM and AFM platform for the life sciences