In this article the authors demonstrate that intermittent-contact atomic force microscopy (AFM) can detect the Hall effect in conducting domain walls. NANOSENSORS PPP-EFM AFM tips… Read More »Hall effect in charged conducting ferroelectric domain walls
NANOSENSORS PPP-NCSTAu probes were used for scanning probe characterizations for this publication. Cramer, T. et al. Direct imaging of Defect Formation in Strained Organic Flexible… Read More »Direct imaging of defect formation in strained organic flexible electronics by Scanning Kelvin Probe Microscopy
Are you looking for extra tall tips for nanoprofiling and other applications in this direction? Then look no further. There is a PointProbe Plus version… Read More »PointProbe Plus XL – Extra Tall Tips for Nanoprofiling
The Uniqprobe series is going to grow soon… We’ve just successfully tested a novel type. Stay tuned to find out more.
A new video showing the self-sensing and self-actuating NANOSENSORS Akiyama AFM probe in motion has been uploaded to the NANOSENSORS youtube channel. Stroboscopic motion views… Read More »Watch the Akiyama Probe in motion
