アドバンスドテックシリーズはシャープな三角錐の探針がカンチレバー先端より更に前方へと突き出ているのが特長。 探針を確実に測定領域にポジショニングしたい場合や、探針先端を直接見ながら作業するナノマニピュレーションなどのアプリケーションに最適です。 Screencasts on the NANOSENSORS AdvancedTEC tip view AFM probes are also available in English:
For the full brochure please follow this link: http://www.nanosensors.com/pdf/AdvancedTEC.pdf
Product Screencast on the NANOSENSORS™ AdvancedTEC™ – Advanced Tip at the End of the Cantilever – High Resolution Silicon AFM Probes held by product developer Dr. Oliver Krause.
Read More »Product screencast NANOSENSORS™ AdvancedTEC™ AFM probes
We would like to thank our customers for their overwhelming interest in this new product and for their enthusiastic feedback. The AdvancedTEC™ probe will be… Read More »NANOSENSORS™ AdvancedTEC™ Silicon-SPM-probes for Contact Mode, Non-Contact and Force Modulation Mode are now available