tip view AFM tips

Energy dissipation on magic angle twisted bilayer graphene

by NANOSENSORS
11 December 202411 December 2024
Science & Technology

Fig. 1 a and b from Alexina Ollier et al 2023 “Energy dissipation on magic angle twisted bilayer graphene”: Pendulum atomic force microscope (p-AFM) tip oscillating on top of a twisted bilayer graphene (tBLG) device is measuring energy loss. a schematics of the measured device. The sample is composed of a p-doped silicon backgate (dark gray), followed by a 300 nm thick silicon dioxide layer (violet) and 10 nm hexagonal boron nitride (hBN, light blue). From the top tBLG is encapsulated with 10nm hBN film. b p-AFM image of the tBLG device, the white dotted rectangle is the device with a size of 4.1 μm × 5.8 μm. NANOSENSORS AdvancedTEC ATEC-CONT tip-view AFM probes were used.

Traditional Joule dissipation omnipresent in today’s electronic devices is well understood while the energy loss of the strongly interacting electron systems remains largely unexplored. Twisted… Read More »Energy dissipation on magic angle twisted bilayer graphene

Electron-beam lithography of nanostructures at the tips of scanning probe cantilevers

by NANOSENSORS
16 February 2024
Science & Technology

It is always exiting to see what our creative and innovative users are doing with our AFM probes. In their article “Electron-beam lithography of nanostructures… Read More »Electron-beam lithography of nanostructures at the tips of scanning probe cantilevers

Chemically characterizing the cortical cell nano-structure of human hair using atomic force microscopy integrated with infrared spectroscopy (AFM-IR)

by NANOSENSORS
7 December 202215 March 2023
Science & Technology

Figure 2 from A. P. Fellows et al “Chemically characterizing the cortical cell nano-structure of human hair using atomic force microscopy integrated with infrared spectroscopy (AFM-IR)”: AFM-IR data obtained from a human hair cross-section (approx. 300 nm thick) showing (a) a schematic structural representation of the cortical cell (b) average spectra corresponding to each observed region (macrofibril and Ext-matrix) (c) AFM height map and (d)-(l) IR-intensity maps recorded in contact mode across a 2.5 × 2.5 μm region of the surface at a number of different infrared frequencies corresponding to contributions observed in the spectra (each shown above the corresponding image) for a representative fibre section. NANOSENSORS AdvancedTEC ATEC-CONTAu tip view AFM probes were used.

The structure of hair fibres has been the focus of much research over the last century with several techniques used to investigate their structure. *… Read More »Chemically characterizing the cortical cell nano-structure of human hair using atomic force microscopy integrated with infrared spectroscopy (AFM-IR)

Direct Measurement of Adhesion Force of Individual Aerosol Particles by Atomic Force Microscopy

by NANOSENSORS
26 July 202015 March 2023
Science & Technology

Figure 2 from «Direct Measurement of Adhesion Force of Individual Aerosol Particles by Atomic Force Microscopy» by Kohei Ono et al: Atomic force microscopy (AFM) mag image (a), slope mapping (b), and adhesion force mapping (c) obtained from the same 1 μm PSL particle. Representative force–distance curves are shown for the point at which the tip is properly in contact with the surface with sufficient stroke (loading force), at the proper angle (d) and for the point further towards the edge where the tip is barely touching the surface at a steep angle (e). The black lines in panels (d) and (e) show the baseline in which the tip did not touch the particle or substrate. A plot of the relationship between the slope and the adhesion force is shown in panel (f). The plots in the shaded area are considered to represent the adhesion force of the particle.

In the article «Direct Measurement of Adhesion Force of Individual Aerosol Particles by Atomic Force Microscopy» Kohei Ono, Yuki Mizushima, Masaki Furuya, Ryota Kunihisa, Nozomu… Read More »Direct Measurement of Adhesion Force of Individual Aerosol Particles by Atomic Force Microscopy

On-chip integration of single solid-state quantum emitters with a SiO2 photonic platform

by NANOSENSORS
8 January 202015 March 2023
Science & Technology

One important building block for future integrated nanophotonic devices is the scalable on-chip interfacing of single photon emitters and quantum memories with single optical modes.*… Read More »On-chip integration of single solid-state quantum emitters with a SiO2 photonic platform

Visualizing the bidirectional optical transfer function for near-field enhancement in waveguide coupled plasmonic transducers

by NANOSENSORS
22 October 201915 March 2023
Science & Technology

In their article “Visualizing the bidirectional optical transfer function for near-field enhancement in waveguide coupled plasmonic transducers” Lauren M. Otto, D. Frank Ogletree, Shaul Aloni,… Read More »Visualizing the bidirectional optical transfer function for near-field enhancement in waveguide coupled plasmonic transducers

High-resolution imaging of graphene by tip-enhanced coherent anti-Stokes Raman scattering

by NANOSENSORS
2 June 201915 March 2023
Science & Technology

In their research article “High-resolution imaging of graphene by tip-enhanced coherent anti-Stokes Raman scattering” Xiaolong Kou, Qian Zhou, Dong Wang, Jinghe Yuan, Xiaohong Fang and… Read More »High-resolution imaging of graphene by tip-enhanced coherent anti-Stokes Raman scattering