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| Property | Nominal Value | Specified Range |
|---|---|---|
| Resonance Frequency [kHz] | 190 | 146 - 236 |
| Force Constant [N/m] | 48 | 21 - 98 |
| Length [µm] | 225 | 215 - 235 |
| Mean Width [µm] | 38 | 30 - 45 |
| Thickness [µm] | 7 | 6 - 8 |
| Order Code | AFM probes per pack | Data sheet |
|---|---|---|
| AR5-NCLR-10 | 10 | of all probes |
| AR5-NCLR-20 | 20 | of all probes |
| AR5-NCLR-50 | 50 | |
| AR5-NCLR-W | 370 |
Due to their unique geometry the tips of the are more susceptible to tip damage by electrostatic discharge (ESD) than other Silicon-SPM-Probes.
Electric fields near the probe chip may lead to field evaporation which can blunt the tip apex of the probe tip. Therefore the NANOSENSORS™ are shipped in specially designed ESD-safe chip carriers.
NANOSENSORS™ recommends to their customers to take appropriate precautions to avoid tip damage due to electrostatic discharge when handling the probes. This can for example be done by using anti-electrostatic mats, wrist bands and tweezers.
NANOSENSORS™ AR5-NCLR AFM tips are designed for non-contact or tapping mode AFM. The NCL probe is designed for SPM systems requiring a minimum AFM cantilever length > 125 µm or a resonance frequency of less than 400 kHz. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This AFM cantilever type combines high operation stability with outstanding sensitivity and fast scanning ability.
For measurements on samples with sidewall angles approaching 90° NANOSENSORS™ produces specially tailored AFM tips. These AFM tips are FIB (Focused Ion Beam) milled to achieve a high aspect ratio portion better than 5:1 at the end of the common silicon AFM tip. This subtractive method of producing the high aspect ratio needle offers the advantage of high lateral stiffness and rigidity of the AFM tip.
