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CDT-CONTR
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CDT-CONTR

Cantilever data:
Property Nominal Value Specified Range
Resonance Frequency [kHz] 20 11 - 29
Force Constant [N/m] 0.5 0.1 - 1.7
Length [µm] 450 440 - 460
Mean Width [µm] 50 42.5 - 57.5
Thickness [µm] 2 1 - 3
Order codes and shipping units:
Order Code AFM probes per pack Data sheet
CDT-CONTR-10 10 of all probes
CDT-CONTR-20 20 of all probes
CDT-CONTR-50 50
DT Diamond coated tip
DT Diamond coated tip
Raman spectrum of diamond coating
Raman spectrum of diamond coating
NANOSENSORS™ Diamond Coated PointProbe Plus Silicon AFM Probes

Conductive Diamond Coated Tip - Contact Mode - Reflex Coating

NANOSENSORS™ CDT-CONTR probes are designed for contact mode (repulsive mode) SPM imaging.

For applications that require a wear resistant and an electrically conductive AFM tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.

The typical macroscopic AFM tip radius of curvature is between 100 and 200 nm. Nanoroughness in the 10 nm regime improves the resolution on flat surfaces.

The AFM probe offers unique features:

  • real diamond coating, highly doped
  • AFM tip height 10 - 15 µm
  • high mechanical Q-factor for high sensitivity

The reflective coating is an approximately 30 nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.

How to optimize AFM scanning parameters: list-img


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