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CDT-FMR
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CDT-FMR

Cantilever data:
Property Nominal Value Specified Range
Resonance Frequency [kHz] 105 65 - 155
Force Constant [N/m] 6.2 1.5 - 18.3
Length [µm] 225 215 - 235
Mean Width [µm] 27.5 20 - 35
Thickness [µm] 3 2 - 4
Order codes and shipping units:
Order Code AFM probes per pack Data sheet
CDT-FMR-10 10 of all probes
CDT-FMR-20 20 of all probes
CDT-FMR-50 50
DT Diamond coated tip
DT Diamond coated tip
Raman spectrum of diamond coating
Raman spectrum of diamond coating
NANOSENSORS™ Diamond Coated PointProbe Plus Silicon AFM Probes

Conductive Diamond Coated Tip - Force Modulation Mode - Reflex Coating

NANOSENSORS™ CDT-FMR probes are designed for force modulation microscopy. The force constant of this AFM probe type spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The FM sensor serves also as a basis for magnetic coatings (MFM). Furthermore non-contact or tapping mode operation is possible with the FM probe but with reduced operation stability.

For applications that require a wear resistant and an electrically conductive AFM tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.

The typical macroscopic AFM tip radius of curvature is between 100 and 200 nm. Nanoroughness in the 10 nm regime improves the resolution on flat surfaces.

The AFM probe offers unique features:

  • real diamond coating, highly doped
  • AFM tip height 10 - 15 µm
  • high mechanical Q-factor for high sensitivity
  • alignment grooves on backside of silicon holder chip
  • precise alignment of the AFM cantilever position (within +/- 2 µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series

The reflective coating is an approximately 30 nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.

How to optimize AFM scanning parameters: list-img


Huimin Qiao, Pin Zhao, Owoong Kwon, Ahrum Sohn, Fangping Zhuo, Dong-Min Lee, Changhyo Sun, Daehee Seol, Daesu Lee, Sang-Woo Kim and Yunseok Kim
Mixed Triboelectric and Flexoelectric Charge Transfer at the Nanoscale
Advanced Science, Volume 8, Issue 20, October 20, 2021, 2101793
DOI: https://doi.org/10.1002/advs.202101793


Hironori Fujisawa, Kazuma Ikeda and Seiji Nakashima
Nonvolatile operation of vertical ferroelectric gate-all-around nanowire transistors
Japanese Journal of Applied Physics, 2021, 60 SFFB10
DOI: https://doi.org/10.35848/1347-4065/ac127c
https://iopscience.iop.org/article/10.35848/1347-4065/ac127c/meta


M. A. Rose, J. Barnett, D. Wendland, F. V. E. Hensling,, J. M. Boergers, M. Moors, R. Dittmann, T. Taubner and F. Gunkel
Local inhomogeneities resolved by scanning probe techniques and their impact on local 2DEG formation in oxide heterostructures
RSC, Nanoscale Adv., 2021, 3, 4145-4155
DOI: 10.1039/D1NA00190F


Kyoung-Won Park, Chang Sub Kim
Deformation-induced charge redistribution in ceria thin film at room temperature
Acta Materialia, Volume 191, 1 June 2020, Pages 70-80
DOI: https://doi.org/10.1016/j.actamat.2020.03.029


Kazuma Miyagi, Hao Mei, Tanguy Terlier, Gila E. Stein and Rafael Verduzco
Analysis of Surface Segregation of Bottlebrush Polymer Additives in Thin Film Blends with Attractive Intermolecular Interactions
Macromolecules 2020, 53, 15, 6720–6730
DOI: https://doi.org/10.1021/acs.macromol.0c00744


Ding Wang, Jinhyeong Jang, Kayoung Kim, Jinhyun Kim, and Chan Beum Park
“Tree to Bone”: Lignin/Polycaprolactone Nanofibers for Hydroxyapatite Biomineralization
Biomacromolecules 2019, 20, 7, 2684–2693
DOI: https://doi.org/10.1021/acs.biomac.9b00451


Ryan Keech, Linghan Ye, James L. Bosse, Giovanni Esteves, Jonathon Guerrier, Jacob L. Jones, Marcelo A. Kuroda, Bryan D. Huey, Susan Trolier-McKinstry
Declamped Piezoelectric Coefficients in Patterned 70/30 Lead Magnesium Niobate–Lead Titanate Thin Films
Advanced Functional Materials, Volume 27, Issue 9, March 3, 2017, 1605014
DOI: https://doi.org/10.1002/adfm.201605014


Ivan Estevez, Pascal Chrétien, Olivier Schneegans, and Frédéric Houzé
Specific methodology for capacitance imaging by atomic force microscopy: A breakthrough towards an elimination of parasitic effects
Applied Physics Letters 104, 083108 (2014)
DOI: https://doi.org/10.1063/1.4866607


James L Bosse, Sungjun Lee, Andreas Sø Andersen, Duncan S Sutherland and Bryan D Huey
High speed friction microscopy and nanoscale friction coefficient mapping
Measurement Science and Technology, 2014, Volume 25, Number 11, 115401
DOI: https://doi.org/10.1088/0957-0233/25/11/115401


F. Baudin, L. Di Cioccio, V. Delaye, N. Chevalier, J. Dechamp, H. Moriceau, E. Martinez & Y. Bréchet
Direct bonding of titanium layers on silicon
Microsystem Technologies volume 19, pages 647–653 (2013)
DOI: https://doi.org/10.1007/s00542-012-1664-0


Aurora Dols-Perez, Xavier Sisquella, Laura Fumagalli and Gabriel Gomila
Optical visualization of ultrathin mica flakes on semitransparent gold substrates
Nanoscale Research Letters volume 8, Article number: 305 (2013)
DOI: https://doi.org/10.1186/1556-276X-8-305


G. Gramse1,2, G Gomila1,2 and L Fumagalli1,2
Quantifying the dielectric constant of thick insulators by electrostatic force microscopy: effects of the microscopic parts of the probe
Nanotechnology, 2012, Volume 23, Number 20, 205703
DOI: https://doi.org/10.1088/0957-4484/23/20/205703   


Justice M. P. Alaboson, Qing Hua Wang, Jonathan D. Emery, Albert L. Lipson, Michael J. Bedzyk, Jeffrey W. Elam, Michael J. Pellin, and Mark C. Hersam
Seeding Atomic Layer Deposition of High-k Dielectrics on Epitaxial Graphene with Organic Self-Assembled Monolayers
ACS Nano 2011, 5, 6, 5223–5232
DOI: https://doi.org/10.1021/nn201414d


A. Mdarhri, D. Alamarguy, F .Houzé, S. Noël, S. Volz, H. Li, J.B. Bai
Multi-scale investigation of electronic transport and electromechanical behavior in carbon nanotube materials
Composites Part B: Engineering, Volume 42, Issue 8, December 2011, Pages 2098-2104
DOI: https://doi.org/10.1016/j.compositesb.2011.05.003


R. Arinero, W. Hourani, A. D. Touboul, B. Gautier, M. Ramonda, D. Albertini, L. Militaru, Y. Gonzalez-Velo, C. Guasch, and F. Saigné
Toward a better understanding of the nanoscale degradation mechanisms of ultra-thin Si02/Si films: Investigation of the best experimental conditions with a conductive-atomic force microscope
Journal of Applied Physics 110, 014304 (2011)
DOI: https://doi.org/10.1063/1.3603037


Benjamin J. Leever, Ian P. Murray, Michael F. Durstock, Tobin J. Marks, and Mark C. Hersam
Influence of Indium Tin Oxide Surface Treatment on Spatially Localized Photocurrent Variations in Bulk Heterojunction Organic Photovoltaic Devices
Journal of Physical Chemistry C 2011, 115, 45, 22688–22694
DOI: https://doi.org/10.1021/jp209570h