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PtSi-CONT
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PtSi-CONT

Cantilever data:
Property Nominal Value Specified Range
Resonance Frequency [kHz] 13 6 - 21
Force Constant [N/m] 0.2 0.02 - 0.77
Length [µm] 450 440 - 460
Mean Width [µm] 50 42.5 - 57.5
Thickness [µm] 2 1 - 3
Order codes and shipping units:
Order Code AFM probes per pack Data sheet
PtSi-CONT-10 10 of all probes
PtSi-CONT-20 20 of all probes
PtSi-CONT-50 50
PtSi AFM tip apex
PtSi AFM tip apex
NANOSENSORS™ Platinum Silicide AFM Probes

Platinum Silicide Probes Contact Mode

NANOSENSORS™ PtSi-CONT are designed for contact mode (repulsive mode) AFM imaging. Furthermore this AFM probe can be used for force-distance spectroscopy or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due a low force constant.

For applications that require a wear resistant and electrically conductive AFM tip we recommend this type. NANOSENSORS™ PtSi-CONT are suitable for C-AFM, Tunneling AFM (TUNA) and Scanning Capacitance Microscopy (SCM).

The AFM probe offers unique features:

  • platinum silicide coating with excellent conductivity and good wear-out behaviour
  • chemically inert
  • high mechanical Q-factor for high sensitivity
  • alignement grooves on backside of the holder chip
  • compatible with PointProbe® Plus XY-Alignment Series
This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.

How to optimize AFM scanning parameters: list-img