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PPP-CONTSCR
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PPP-CONTSCR

Cantilever data:
Property Nominal Value Specified Range
Resonance Frequency [kHz] 25 1 - 57
Force Constant [N/m] 0.2 0.01 - 1.87
Length [µm] 225 215 - 235
Mean Width [µm] 48 40 - 55
Thickness [µm] 1 0.1 - 2
Order codes and shipping units:
Order Code AFM probes per pack Data sheet
PPP-CONTSCR-10 10 of all probes
PPP-CONTSCR-20 20 of all probes
PPP-CONTSCR-50 50
PPP-CONTSCR-W 380 of up to 32 probes
PointProbe® Plus AFM tip front view
PointProbe® Plus AFM tip front view
PointProbe® Plus AFM tip closeup
PointProbe® Plus AFM tip closeup
NANOSENSORS™ PointProbe® Plus AFM Probes

PointProbe® Plus Contact Mode Short Cantilever - Reflex Coating

The PointProbe® Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.

The NANOSENSORS™ PPP-CONTSCR is an alternative AFM cantilever type for contact mode applications. The length of AFM cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode AFM probes for some AFM instruments. Additionally, this AFM probe type allows the application for lateral or friction force mode.

The AFM probe offers unique features:

  • guaranteed AFM tip radius of curvature < 10 nm
  • AFM tip height 10 - 15 µm
  • highly doped silicon to dissipate static charge
  • Al coating on detector side of AFM cantilever
  • high mechanical Q-factor for high sensitivity
  • alignment grooves on backside of silicon holder chip
  • precise alignment of the AFM cantilever position (within +/- 2 µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series

The reflective coating is an approximately 30 nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.

How to optimize AFM scanning parameters: list-img


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