PPP-FMAu

Cantilever data:
Property Nominal Value Specified Range
Resonance Frequency [kHz] 75 45 - 115
Force Constant [N/m] 2.8 0.5 - 9.5
Length [µm] 225 215 - 235
Mean Width [µm] 28 20 - 35
Thickness [µm] 3 2 - 4
Order codes and shipping units:
Order Code AFM probes per pack Data sheet
PPP-FMAu-10 10 of all probes
NANOSENSORS™ PointProbe® Plus AFM Probes

PointProbe® Plus Force Modulation Mode - Au coating

The PointProbe® Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.

NANOSENSORS™ PPP-FMAu is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.

The AFM probe offers unique features:

  • metallic conductivity of the AFM tip
  • AFM tip height 10 - 15 µm
  • Au coating on both sides of the AFM cantilever
  • chemically inert

A metallic layer (Au) is coated on both sides of the AFM cantilever. The tip side coating enhances the conductivity of the AFM tip and allows electrical contacts - the typical AFM tip radius of curvature is less than 50nm. The detector side coating enhances the reflectivity of the laser beam by a factor of 2.5 and prevents light from interfering within the AFM cantilever. The coating process is optimized for stress compensation. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

Please note: Wear at the AFM tip can occur if operating in contact-, friction- or force modulation mode.

This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.

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Journal of Physical Chemistry C 2021, 125, 25, 13741–13748
DOI: https://doi.org/10.1021/acs.jpcc.1c03837


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DOI: https://doi.org/10.1016/j.apsusc.2020.147715


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DOI: https://doi.org/10.1021/acsapm.9b00993


M S Dunaevskiy, P A Alekseev, V A Sharov and A Baranov
The effect of optical cooling of the SPM probe in the optomechanical resonator
IOP Conference Series: Materials Science and Engineering, 2019, 699 012011
DOI: https://doi.org/10.1088/1757-899X/699/1/012011


Katarzyna E. Hnida, Mateusz Marzec, Ewelina Wlaźlak, Damian Chlebda, Konrad Szaciłowski, Dominika Gilek, Grzegorz D. Sulka and Marek Przybylski
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DOI: https://doi.org/10.1016/j.electacta.2019.02.111


Junghoon Jahng, Eric O. Potma and Eun Seong Lee
Nanoscale spectroscopic origins of photoinduced tip–sample force in the midinfrared
PNAS (2019), 116 (52) 26359-26366
DOI: https://doi.org/10.1073/pnas.1913729116


Yuki Takahashi, Takashi Fujihara, Naritaka Kobayashi, Seiichiro Nakabayashi, Zsombor Miskolczy and László Biczók
Electron transfer kinetics of methylviologen included in 4-sulfonatocalix[n]arenes at glassy carbon electrode; adiabaticity and activation energy
Chemical Physics Letters, Volume 708, 16 September 2018, Pages 222-227
DOI: https://doi.org/10.1016/j.cplett.2018.08.005


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DOI: https://doi.org/10.1063/1.5027849


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Nature Nanotechnology volume 12, pages1055–1059 (2017)
DOI: https://doi.org/10.1038/nnano.2017.180


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Nanoscale chemical imaging by photoinduced force microscopy
Science Advances, 25 Mar 2016, Vol 2, Issue 3
DOI: https://doi.org/10.1126/sciadv.1501571