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| Property | Nominal Value | Specified Range |
|---|---|---|
| Resonance Frequency [kHz] | 300 | 200 - 400 |
| Force Constant [N/m] | 26 | 10 - 58 |
| Length [µm] | 125 | 115 - 135 |
| Mean Width [µm] | 29 | 21.5 - 36.5 |
| Thickness [µm] | 3.5 | 2.5 - 4.5 |
| Order Code | AFM probes per pack | Data sheet |
|---|---|---|
| PPP-NCR-10 | 10 | of all probes |
| PPP-NCR-20 | 20 | of all probes |
| PPP-NCR-50 | 50 | |
| PPP-NCR-W | 380 | of up to 32 probes |
The PointProbe® Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.
NANOSENSORS™ PPP-NCR AFM probes are especially designed with the same mechanical properties as the Olympus** AC160 AFM probe for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode).This AFM probe combines high operation stability with outstanding sensitivity.
This AFM probe offers unique features:
The reflective coating is an approximately 30 nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.
This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.
