Nanosensors logo

PointProbe® Plus XY-alignment Contact Mode Reflex Coating

The XY-auto-alignment probes for Contact mode application with a Reflective coating extend the plug-and-fit alignment concept of the Alignment Chip (ALIGN) to 450 µm long AFM cantilevers optimized for contact mode applications. AFM probe exchange with an AFM tip repositioning accuracy of better than ± 8 µm is possible for all AFM probes of the XY-alignment AFM probes series - independent of their AFM cantilever length. This series is adjusted to the AFM tip position of probes with an AFM cantilever length of 225 µm.

As a matter of course, the features of the proven PointProbe® Plus series such as high application versatility, compatibility with most commercial SPMs, extremely low and reproducible AFM tip radius as well as a precisely defined AFM tip shape are maintained. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS™ PPP-CONTR AFM probes are designed for contact mode (repulsive mode) AFM imaging. This AFM probe can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.

The reflective coating is an approximately 30 nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

The AFM probe offers unique features:

• guaranteed AFM tip radius of curvature < 10 nm
• AFM tip height 10 - 15 µm
• highly doped silicon to dissipate static charge
• Al coating on detector side of AFM cantilever
• chemically inert
• high mechanical Q-factor for high sensitivity
• AFM tip repositioning accuracy of better than ± 8 µm (in combination with Alignment Chip)