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| Property | Nominal Value | Specified Range |
|---|---|---|
| Resonance Frequency [kHz] | 45 | |
| Force Constant [N/m] | 5 | |
| Length [µm] | 310 | |
| Mean Width [µm] | 30 | |
| Thickness [µm] | 3.7 |
| Order Code | AFM probes per pack | Data sheet |
|---|---|---|
| A-PROBE-10 | 10 | of all probes |
Due to their unique geometry the tips of the are more susceptible to tip damage by electrostatic discharge (ESD) than other Silicon-SPM-Probes.
Electric fields near the probe chip may lead to field evaporation which can blunt the tip apex of the probe tip. Therefore the NANOSENSORS™ are shipped in specially designed ESD-safe chip carriers.
NANOSENSORS™ recommends to their customers to take appropriate precautions to avoid tip damage due to electrostatic discharge when handling the probes. This can for example be done by using anti-electrostatic mats, wrist bands and tweezers.
Akiyama-Probe is based on a quartz tuning fork combined with a micromachined AFM cantilever. The great advantage of this novel AFM probe is that one can benefit from both the tuning fork’s extremely stable oscillation and the silicon AFM cantilever’s reasonable spring constant with one AFM probe.
Akiyama-Probe is equipped with a special version of the NANOSENSORS™ AdvancedTEC, a high-end sharp silicon AFM tip and has an excellent imaging capability on various samples with different properties, which is as high as that of a conventional optical lever system.
Akiyama-Probe requires neither optical detection, nor an external shaker. Akiyama-Probe occupies only a small volume above the sample. These features make it very attractive for creating a new generation of scanning probe microscopy (SPM) instruments.
Important notice!
Akiyama-Probe is not a plug-and-play probe. If it is not used in an AFM specifically built for its use as offered by some manufacturers it needs its own specific set-up to work.
For more information and technical details visit Akiyama-Probe website »
