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| Property | Nominal Value | Specified Range |
|---|---|---|
| Resonance Frequency [kHz] | 75 | 45 - 115 |
| Force Constant [N/m] | 2.8 | 0.5 - 9.5 |
| Length [µm] | 225 | 215 - 235 |
| Mean Width [µm] | 30 | 20 - 35 |
| Thickness [µm] | 3 | 2 - 4 |
| Order Code | AFM probes per pack | Data sheet |
|---|---|---|
| SSS-FM-10 | 10 | of all probes |
| SSS-FM-20 | 20 | of all probes |
| SSS-FM-50 | 50 |
Due to their unique geometry the tips of the are more susceptible to tip damage by electrostatic discharge (ESD) than other Silicon-SPM-Probes.
Electric fields near the probe chip may lead to field evaporation which can blunt the tip apex of the probe tip. Therefore the NANOSENSORS™ are shipped in specially designed ESD-safe chip carriers.
NANOSENSORS™ recommends to their customers to take appropriate precautions to avoid tip damage due to electrostatic discharge when handling the probes. This can for example be done by using anti-electrostatic mats, wrist bands and tweezers.
NANOSENSORS™ SSS-FM AFM probes are designed for force modulation mode.
For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ AFM tip with unrivalled sharpness.
The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The SSS-FM tip serves also as a basis for high resolution AFM tips with magnetic coatings (SSS-MFMR). Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.
The AFM probe offers unique features:
