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| Property | Nominal Value | Specified Range |
|---|---|---|
| Resonance Frequency [kHz] | 330 | 204 - 497 |
| Force Constant [N/m] | 42 | 10 - 130 |
| Length [µm] | 125 | 115 - 135 |
| Mean Width [µm] | 30 | 22.5 - 37.5 |
| Thickness [µm] | 4 | 3 - 5 |
| Order Code | AFM probes per pack | Data sheet |
|---|---|---|
| SSS-NCH-10 | 10 | of all probes |
| SSS-NCH-20 | 20 | of all probes |
| SSS-NCH-50 | 50 |
Due to their unique geometry the tips of the are more susceptible to tip damage by electrostatic discharge (ESD) than other Silicon-SPM-Probes.
Electric fields near the probe chip may lead to field evaporation which can blunt the tip apex of the probe tip. Therefore the NANOSENSORS™ are shipped in specially designed ESD-safe chip carriers.
NANOSENSORS™ recommends to their customers to take appropriate precautions to avoid tip damage due to electrostatic discharge when handling the probes. This can for example be done by using anti-electrostatic mats, wrist bands and tweezers.
NANOSENSORS™ SSS-NCH AFM probes are designed for non-contact mode or tapping mode AFM.
For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ AFM tip with unrivalled sharpness.
