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SSS-SEIHR
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SSS-SEIHR

Cantilever data:
Property Nominal Value Specified Range
Resonance Frequency [kHz] 130 96 - 175
Force Constant [N/m] 15 5 - 37
Length [µm] 225 215 - 235
Mean Width [µm] 33 25 - 40
Thickness [µm] 5 4 - 6
Order codes and shipping units:
Order Code AFM probes per pack Data sheet
SSS-SEIHR-10 10 of all probes
SSS-SEIHR-20 20 of all probes
SSS-SEIHR-50 50

Special handling information for NANOSENSORS™

Due to their unique geometry the tips of the are more susceptible to tip damage by electrostatic discharge (ESD) than other Silicon-SPM-Probes.

Electric fields near the probe chip may lead to field evaporation which can blunt the tip apex of the probe tip. Therefore the NANOSENSORS™ are shipped in specially designed ESD-safe chip carriers.

NANOSENSORS™ recommends to their customers to take appropriate precautions to avoid tip damage due to electrostatic discharge when handling the probes. This can for example be done by using anti-electrostatic mats, wrist bands and tweezers.

SuperSharpSilicon AFM tip closeup
SuperSharpSilicon AFM tip closeup
NANOSENSORS™ SuperSharpSilicon

SuperSharpSilicon™ - SEIKO Microscopes - Non-Contact / Tapping Mode - High Force Constant - Reflex Coating

For owners of a Seiko Instruments microscope using the non-contact mode we recommend the NANOSENSORS™ SEIH type (Seiko Instruments / high force constant). Compared with the ZEIH type the force constant is further reduced.

For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ AFM tip with unrivalled sharpness.

The AFM probe offers unique features:

  • guaranteed AFM tip radius of curvature < 5 nm
  • typical AFM tip radius of curvature of 2 nm
  • typical aspect ratio at 200 nm from AFM tip apex in the order of 4:1
  • half cone angle at 200 nm from apex < 10°
  • highly doped silicon to dissipate static charge
  • high mechanical Q-factor for high sensitivity
  • alignment grooves on backside of silicon holder chip
  • precise alignment of the AFM cantilever position (within +/- 2 µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series

The reflective coating is an approximately 30 nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.

How to optimize AFM scanning parameters: list-img

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