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| Property | Nominal Value | Specified Range |
|---|---|---|
| Resonance Frequency [kHz] | 130 | 96 - 175 |
| Force Constant [N/m] | 15 | 5 - 37 |
| Length [µm] | 225 | 215 - 235 |
| Mean Width [µm] | 33 | 25 - 40 |
| Thickness [µm] | 5 | 4 - 6 |
| Order Code | AFM probes per pack | Data sheet |
|---|---|---|
| SSS-SEIHR-10 | 10 | of all probes |
| SSS-SEIHR-20 | 20 | of all probes |
| SSS-SEIHR-50 | 50 |
Due to their unique geometry the tips of the are more susceptible to tip damage by electrostatic discharge (ESD) than other Silicon-SPM-Probes.
Electric fields near the probe chip may lead to field evaporation which can blunt the tip apex of the probe tip. Therefore the NANOSENSORS™ are shipped in specially designed ESD-safe chip carriers.
NANOSENSORS™ recommends to their customers to take appropriate precautions to avoid tip damage due to electrostatic discharge when handling the probes. This can for example be done by using anti-electrostatic mats, wrist bands and tweezers.
For owners of a Seiko Instruments microscope using the non-contact mode we recommend the NANOSENSORS™ SEIH type (Seiko Instruments / high force constant). Compared with the ZEIH type the force constant is further reduced.
For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ AFM tip with unrivalled sharpness.
The reflective coating is an approximately 30 nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.
This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.
